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dc.contributor.authorAhumada García, Roberto
dc.contributor.authorZabala-Blanco, David
dc.contributor.authorSoto, Ismael
dc.contributor.authorLópez-Cortés, Xaviera A.
dc.contributor.authorBarrientos, Ricardo
dc.date.accessioned2023-03-08T13:27:46Z
dc.date.available2023-03-08T13:27:46Z
dc.date.issued2022
dc.identifier.urihttp://repositorio.ucm.cl/handle/ucm/4493
dc.description.abstractDiseases in agricultural crops are a risk for fruit productivity and quality. Chile is a fruit exporting country; that needs the development of technologies for diseases prevention and treatment. Farmers have been exploring how to use Artificial Intelligence to solve problems. Nowadays, deep artificial intelligence models have a great performance. However, farmers need to reduce economic costs, thus, it is important to explore artificial intelligence models. These models should be easy to implement on low-cost electronic devices. Extreme Learning Machines (ELM) stand out for their fast and stable training, and the models’ implementation is accessible to all public. This work presents the first approach to the binary classification of diseased and healthy apple leaves through ELM. In this research, it was used: 1) standard ELM; 2) regularized ELM; 3) weighted ELM. The weighted ELM performance reaches an accuracy = 0.66 and geometric mean = 0.6. The ELM models results show that are potential and feasible to classify complex images of diseased and healthy leaves. However, ELMs do not perform as well with this data compared to CNN.es_CL
dc.language.isoenes_CL
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 Chile*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/cl/*
dc.sourceInternational Conference on Automation/XXV Congress of the Chilean Association of Automatic Control (ICA-ACCA), Curicó, Chile, 1-7es_CL
dc.subjectTraininges_CL
dc.subjectProductivityes_CL
dc.subjectPerformance evaluationes_CL
dc.subjectCostses_CL
dc.subjectExtreme learning machineses_CL
dc.subjectBiological system modelinges_CL
dc.subjectCropses_CL
dc.titleClassification of diseased and healthy apple leaves through extreme learning machineses_CL
dc.typeArticlees_CL
dc.ucm.facultadFacultad de Ciencias de la Ingenieríaes_CL
dc.ucm.indexacionScopuses_CL
dc.ucm.uriieeexplore.ieee.org/document/10006199es_CL
dc.ucm.doidoi.org/10.1109/ICA-ACCA56767.2022.10006199es_CL


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Atribución-NoComercial-SinDerivadas 3.0 Chile
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