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dc.contributor.authorAcevedo-Letelier, Mónica E.
dc.contributor.authorVilches-Ponce, Karina
dc.contributor.authorMora, Marco
dc.date.accessioned2019-05-15T16:08:32Z
dc.date.available2019-05-15T16:08:32Z
dc.date.issued2019
dc.identifier.urihttp://repositorio.ucm.cl/handle/ucm/2090
dc.description.abstractThe speckle produces severe degradations in digital images, which could be introduced by technological devices during the acquisition, capture or transmission of the images. This perturbation affects, for instance, medical and satellite images. Recently, some methods defined in the bi-geometric structure have presented significant improvements in the processing of image with speckle. In this work, we review some aspects of the bi-geometric structure including a discussion about some of the applications found in the literature focused in the detection of contours in grey scale images with speckle.es_CL
dc.language.isoenes_CL
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 Chile*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/cl/*
dc.sourceJournal of Physics: Conference Series, 1160, 012010es_CL
dc.titleContour detection in images with speckle by using the bi-geometric structurees_CL
dc.typeArticlees_CL
dc.ucm.facultadFacultad de Ciencias Básicases_CL
dc.ucm.indexacionScopuses_CL
dc.ucm.uriiopscience.iop.org/article/10.1088/1742-6596/1160/1/012010es_CL
dc.ucm.doidoi.org/10.1088/1742-6596/1160/1/012010es_CL


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Atribución-NoComercial-SinDerivadas 3.0 Chile
Except where otherwise noted, this item's license is described as Atribución-NoComercial-SinDerivadas 3.0 Chile