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Raman characterization of CuCr2-xSnx S4 spinels
(2019)
Polycrystalline thiospinels CuCr2-xSnxS4 (x = 0.4, 0.8, 1.0 and 1.4) were synthesized via conventional solid-state reaction. The samples were characterized by powder X-ray diffraction (XRD), energy-dispersive X-ray analysis ...